Electronic Devices

The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.

A series of Distinguished Lecturer talks on topics in current transistor and electron device research, reflecting on the challenges ahead and the rewards inherent in overcoming them.

The event 'More Than Moore: Advances in Devices, Characterisation and Modelling' consists of a series of 45 minute talks from some of the leading researchers in the field of electron devices.