IEEE UK & Ireland Electron Devices Chapter Distinguished Lectures | More Than Moore: Advances in Devices, Characterisation and Modelling
The event More Than Moore: Advances in Devices, Characterisation and Modelling consists of a series of 45 minute talks from some of the leading researchers in the field of electron devices.
- Susanna Regiani: Modeling and TCAD-based investigations of HCS degradation in Power MOSFETs
- Elena Gnani: TunnelFETs: prospects and challenges
- Yogesh Chauhan: RF Characterisation and Modelling of GaN and LDMOS Transistors
- Wladek Grabinski: European IHP OpenPKD Initiative
- Mike Brison: QUCS-S – a central tool in the openPDK IC design flow
- Ram Achar: Emerging challenges of high speed interconnects and signal integrity
- M. De Souza: High efficiency power amplifiers in GaN / Negative capacitance FETs
- Radu A Sporea: Edge signal processing with unconventional thin-film transistors
This is an in-person event which is free to attend, however registration is required.